%0 Conference Paper %1 conf/isqed/KurimotoMOF10 %A Kurimoto, Masanori %A Matsushima, Jun %A Ohbayashi, Shigeki %A Fukui, Yoshiaki %B ISQED %D 2010 %I IEEE %K dblp %P 184-190 %T A yield improvement methodology based on logic redundant repair with a repairable scan flip-flop designed by push rule. %U http://dblp.uni-trier.de/db/conf/isqed/isqed2010.html#KurimotoMOF10 %@ 978-1-4244-6455-5

@inproceedings{conf/isqed/KurimotoMOF10, added-at = {2010-04-22T00:00:00.000+0200}, author = {Kurimoto, Masanori and Matsushima, Jun and Ohbayashi, Shigeki and Fukui, Yoshiaki}, biburl = {https://www.bibsonomy.org/bibtex/2f5a5431669601435e8704759775de3ab/dblp}, booktitle = {ISQED}, crossref = {conf/isqed/2010}, ee = {http://dx.doi.org/10.1109/ISQED.2010.5450455}, interhash = {066ee83e29cc5352ae41b04d7e9e0a9c}, intrahash = {f5a5431669601435e8704759775de3ab}, isbn = {978-1-4244-6455-5}, keywords = {dblp}, pages = {184-190}, publisher = {IEEE}, timestamp = {2015-04-28T10:57:02.000+0200}, title = {A yield improvement methodology based on logic redundant repair with a repairable scan flip-flop designed by push rule.}, url = {http://dblp.uni-trier.de/db/conf/isqed/isqed2010.html#KurimotoMOF10}, year = 2010 }