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%0 Journal Article
%1 journals/mr/LambertMLVTHBP01
%A Lambert, Benoit
%A Malbert, Nathalie
%A Labat, Nathalie
%A Verdier, Frédéric
%A Touboul, André
%A Huguet, P.
%A Bonnet, R.
%A Pataut, G.
%D 2001
%J Microelectron. Reliab.
%K dblp
%N 9-10
%P 1573-1578
%T Evolution of LF noise in Power PHEMT's submitted to RF and DC Step Stresses.
%U http://dblp.uni-trier.de/db/journals/mr/mr41.html#LambertMLVTHBP01
%V 41
@article{journals/mr/LambertMLVTHBP01,
added-at = {2020-02-22T00:00:00.000+0100},
author = {Lambert, Benoit and Malbert, Nathalie and Labat, Nathalie and Verdier, Frédéric and Touboul, André and Huguet, P. and Bonnet, R. and Pataut, G.},
biburl = {https://www.bibsonomy.org/bibtex/20995dba62780eeb0587005fb9a2a2bcd/dblp},
ee = {https://doi.org/10.1016/S0026-2714(01)00186-X},
interhash = {0e5e3032b40570adef2ff1e8dfec58c7},
intrahash = {0995dba62780eeb0587005fb9a2a2bcd},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = {9-10},
pages = {1573-1578},
timestamp = {2020-02-25T13:26:56.000+0100},
title = {Evolution of LF noise in Power PHEMT's submitted to RF and DC Step Stresses.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr41.html#LambertMLVTHBP01},
volume = 41,
year = 2001
}