%0 Conference Paper %1 conf/norchip/TurnquistLMK11 %A Turnquist, Matthew J. %A Laulainen, Erkka %A Mäkipää, Jani %A Koskinen, Lauri %B NORCHIP %D 2011 %I IEEE %K dblp %P 1-4 %T Measurement of a system-adaptive error-detection sequential circuit with subthreshold SCL. %U http://dblp.uni-trier.de/db/conf/norchip/norchip2011.html#TurnquistLMK11 %@ 978-1-4577-0514-4

@inproceedings{conf/norchip/TurnquistLMK11, added-at = {2017-05-21T00:00:00.000+0200}, author = {Turnquist, Matthew J. and Laulainen, Erkka and Mäkipää, Jani and Koskinen, Lauri}, biburl = {https://www.bibsonomy.org/bibtex/2904205279611d9f628cef06158138b2c/dblp}, booktitle = {NORCHIP}, crossref = {conf/norchip/2011}, ee = {https://doi.org/10.1109/NORCHP.2011.6126746}, interhash = {19c5d5c6d8b2ebfd88b22a7d028f5e7c}, intrahash = {904205279611d9f628cef06158138b2c}, isbn = {978-1-4577-0514-4}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2019-10-17T19:07:49.000+0200}, title = {Measurement of a system-adaptive error-detection sequential circuit with subthreshold SCL.}, url = {http://dblp.uni-trier.de/db/conf/norchip/norchip2011.html#TurnquistLMK11}, year = 2011 }