%0 Journal Article %1 journals/mr/SozziM02 %A Sozzi, Giovanna %A Menozzi, Roberto %D 2002 %J Microelectron. Reliab. %K dblp %N 1 %P 53-59 %T High-electric-field effects and degradation of AlGaAs/GaAs power HFETs: a numerical study. %U http://dblp.uni-trier.de/db/journals/mr/mr42.html#SozziM02 %V 42

@article{journals/mr/SozziM02, added-at = {2020-02-22T00:00:00.000+0100}, author = {Sozzi, Giovanna and Menozzi, Roberto}, biburl = {https://www.bibsonomy.org/bibtex/285847a7bc775ed84cee5d60c260b6124/dblp}, ee = {https://doi.org/10.1016/S0026-2714(01)00240-2}, interhash = {1b95f762e06502c53f2caa906bd9a0b7}, intrahash = {85847a7bc775ed84cee5d60c260b6124}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 1, pages = {53-59}, timestamp = {2020-02-25T13:28:53.000+0100}, title = {High-electric-field effects and degradation of AlGaAs/GaAs power HFETs: a numerical study.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr42.html#SozziM02}, volume = 42, year = 2002 }