%0 Conference Paper %1 conf/irps/VandemaeleKTSMC19 %A Vandemaele, Michiel %A Kaczer, Ben %A Tyaginov, Stanislav %A Stanojevic, Zlatan %A Makarov, Alexander %A Chasin, Adrian Vaisman %A Bury, Erik %A Mertens, Hans %A Linten, Dimitri %A Groeseneken, Guido %B IRPS %D 2019 %I IEEE %K dblp %P 1-7 %T Full (Vg, Vd) Bias Space Modeling of Hot-Carrier Degradation in Nanowire FETs. %U http://dblp.uni-trier.de/db/conf/irps/irps2019.html#VandemaeleKTSMC19 %@ 978-1-5386-9504-3

@inproceedings{conf/irps/VandemaeleKTSMC19, added-at = {2023-05-24T00:00:00.000+0200}, author = {Vandemaele, Michiel and Kaczer, Ben and Tyaginov, Stanislav and Stanojevic, Zlatan and Makarov, Alexander and Chasin, Adrian Vaisman and Bury, Erik and Mertens, Hans and Linten, Dimitri and Groeseneken, Guido}, biburl = {https://www.bibsonomy.org/bibtex/20342cba23700caeb5e4e120b9fe88271/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2019}, ee = {https://doi.org/10.1109/IRPS.2019.8720406}, interhash = {1c2637947049b47d596af8582ad108cb}, intrahash = {0342cba23700caeb5e4e120b9fe88271}, isbn = {978-1-5386-9504-3}, keywords = {dblp}, pages = {1-7}, publisher = {IEEE}, timestamp = {2024-04-10T16:55:06.000+0200}, title = {Full (Vg, Vd) Bias Space Modeling of Hot-Carrier Degradation in Nanowire FETs.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2019.html#VandemaeleKTSMC19}, year = 2019 }