%0 Conference Paper %1 conf/iscas/OkadaYO03 %A ichi Okada, Ken %A Yamaoka, Kento %A Onodera, Hidetoshi %B ISCAS (5) %D 2003 %I IEEE %K dblp %P 513-516 %T Statistical modeling of gate-delay variation with consideration of intra-gate variability. %U http://dblp.uni-trier.de/db/conf/iscas/iscas2003-5.html#OkadaYO03 %@ 0-7803-7761-3

@inproceedings{conf/iscas/OkadaYO03, added-at = {2016-05-20T00:00:00.000+0200}, author = {ichi Okada, Ken and Yamaoka, Kento and Onodera, Hidetoshi}, biburl = {https://www.bibsonomy.org/bibtex/2d4c78aa47a183076f892395f014845cc/dblp}, booktitle = {ISCAS (5)}, crossref = {conf/iscas/2003}, ee = {http://dx.doi.org/10.1109/ISCAS.2003.1206335}, interhash = {22ae0a15549a2ef439dc3e9052eee530}, intrahash = {d4c78aa47a183076f892395f014845cc}, isbn = {0-7803-7761-3}, keywords = {dblp}, pages = {513-516}, publisher = {IEEE}, timestamp = {2016-05-21T11:45:42.000+0200}, title = {Statistical modeling of gate-delay variation with consideration of intra-gate variability.}, url = {http://dblp.uni-trier.de/db/conf/iscas/iscas2003-5.html#OkadaYO03}, year = 2003 }