%0 Journal Article %1 journals/mr/KakushimaOKKTKSANTSHI10 %A Kakushima, Kuniyuki %A Okamoto, K. %A Koyanagi, T. %A Kouda, M. %A Tachi, Kiichi %A Kawanago, Takamasa %A Song, J. %A Ahmet, Parhat %A Nohira, Hiroshi %A Tsutsui, Kazuo %A Sugii, Nobuyuki %A Hattori, Takeo %A Iwai, Hiroshi %D 2010 %J Microelectron. Reliab. %K dblp %N 3 %P 356-359 %T SrO capping effect for La2O3/Ce-silicate gate dielectrics. %U http://dblp.uni-trier.de/db/journals/mr/mr50.html#KakushimaOKKTKSANTSHI10 %V 50

@article{journals/mr/KakushimaOKKTKSANTSHI10, added-at = {2021-10-14T00:00:00.000+0200}, author = {Kakushima, Kuniyuki and Okamoto, K. and Koyanagi, T. and Kouda, M. and Tachi, Kiichi and Kawanago, Takamasa and Song, J. and Ahmet, Parhat and Nohira, Hiroshi and Tsutsui, Kazuo and Sugii, Nobuyuki and Hattori, Takeo and Iwai, Hiroshi}, biburl = {https://www.bibsonomy.org/bibtex/2aeb692cfdbdefd7b58e27510cefaa859/dblp}, ee = {https://doi.org/10.1016/j.microrel.2009.12.004}, interhash = {259eb47c7d548da726cf0d109c4d8f08}, intrahash = {aeb692cfdbdefd7b58e27510cefaa859}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 3, pages = {356-359}, timestamp = {2024-04-09T02:50:29.000+0200}, title = {SrO capping effect for La2O3/Ce-silicate gate dielectrics.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr50.html#KakushimaOKKTKSANTSHI10}, volume = 50, year = 2010 }