%0 Conference Paper %1 conf/iccad/IwagakiOKF07 %A Iwagaki, Tsuyoshi %A Ohtake, Satoshi %A Kaneko, Mineo %A Fujiwara, Hideo %B ICCAD %D 2007 %E Gielen, Georges G. E. %I IEEE Computer Society %K dblp %P 418-423 %T Efficient path delay test generation based on stuck-at test generation using checker circuitry. %U http://dblp.uni-trier.de/db/conf/iccad/iccad2007.html#IwagakiOKF07 %@ 1-4244-1382-6

@inproceedings{conf/iccad/IwagakiOKF07, added-at = {2023-03-24T00:00:00.000+0100}, author = {Iwagaki, Tsuyoshi and Ohtake, Satoshi and Kaneko, Mineo and Fujiwara, Hideo}, biburl = {https://www.bibsonomy.org/bibtex/2bf87b8be889a0200f708cccb8ddbde07/dblp}, booktitle = {ICCAD}, crossref = {conf/iccad/2007}, editor = {Gielen, Georges G. E.}, ee = {https://dl.acm.org/citation.cfm?id=1326160}, interhash = {2bd656928c4c8ffec889561cbba24b9d}, intrahash = {bf87b8be889a0200f708cccb8ddbde07}, isbn = {1-4244-1382-6}, keywords = {dblp}, pages = {418-423}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T17:54:27.000+0200}, title = {Efficient path delay test generation based on stuck-at test generation using checker circuitry.}, url = {http://dblp.uni-trier.de/db/conf/iccad/iccad2007.html#IwagakiOKF07}, year = 2007 }