%0 Journal Article %1 journals/mj/YangHC11 %A Yang, Hao-I %A Hwang, Wei %A Chuang, Ching-Te %D 2011 %J Microelectron. J. %K dblp %N 1 %P 101-112 %T Impacts of gate-oxide breakdown on power-gated SRAM. %U http://dblp.uni-trier.de/db/journals/mj/mj42.html#YangHC11 %V 42

@article{journals/mj/YangHC11, added-at = {2020-02-22T00:00:00.000+0100}, author = {Yang, Hao-I and Hwang, Wei and Chuang, Ching-Te}, biburl = {https://www.bibsonomy.org/bibtex/20fa0771ee16526c322d257fab2a4d73b/dblp}, ee = {https://doi.org/10.1016/j.mejo.2010.08.020}, interhash = {39107ac7c9834d85c57313ab52572dd5}, intrahash = {0fa0771ee16526c322d257fab2a4d73b}, journal = {Microelectron. J.}, keywords = {dblp}, number = 1, pages = {101-112}, timestamp = {2020-02-25T13:02:18.000+0100}, title = {Impacts of gate-oxide breakdown on power-gated SRAM.}, url = {http://dblp.uni-trier.de/db/journals/mj/mj42.html#YangHC11}, volume = 42, year = 2011 }