%0 Journal Article %1 journals/mr/WrobelTPDBS17 %A Wrobel, Frederic %A Touboul, Antoine D. %A Pouget, Vincent %A Dilillo, Luigi %A Boch, Jerome %A Saigné, Frédéric %D 2017 %J Microelectron. Reliab. %K dblp %P 644-649 %T A calculation method to estimate single event upset cross section. %U http://dblp.uni-trier.de/db/journals/mr/mr76.html#WrobelTPDBS17 %V 76-77

@article{journals/mr/WrobelTPDBS17, added-at = {2023-09-30T00:00:00.000+0200}, author = {Wrobel, Frederic and Touboul, Antoine D. and Pouget, Vincent and Dilillo, Luigi and Boch, Jerome and Saigné, Frédéric}, biburl = {https://www.bibsonomy.org/bibtex/2da7e9a5e056d065c9de6124d73c4ca08/dblp}, ee = {https://doi.org/10.1016/j.microrel.2017.07.056}, interhash = {399a23db0410072f41bc94fd7762a90f}, intrahash = {da7e9a5e056d065c9de6124d73c4ca08}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {644-649}, timestamp = {2024-04-09T02:50:51.000+0200}, title = {A calculation method to estimate single event upset cross section.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr76.html#WrobelTPDBS17}, volume = {76-77}, year = 2017 }