%0 Journal Article %1 journals/mr/DingCGWCLZP18 %A Ding, Lili %A Chen, Wei %A Guo, Hongxia %A Wang, Tan %A Chen, Rongmei %A Luo, Yinhong %A Zhang, Fengqi %A Pan, Xiaoyu %D 2018 %J Microelectron. Reliab. %K dblp %P 337-341 %T Modeling the impact of well contacts on SEE response with bias-dependent Single-Event compact model. %U http://dblp.uni-trier.de/db/journals/mr/mr81.html#DingCGWCLZP18 %V 81

@article{journals/mr/DingCGWCLZP18, added-at = {2020-02-22T00:00:00.000+0100}, author = {Ding, Lili and Chen, Wei and Guo, Hongxia and Wang, Tan and Chen, Rongmei and Luo, Yinhong and Zhang, Fengqi and Pan, Xiaoyu}, biburl = {https://www.bibsonomy.org/bibtex/2457948bdd5bbba0f47e64065e99bd805/dblp}, ee = {https://doi.org/10.1016/j.microrel.2017.11.001}, interhash = {3da7c2b9d68c4b59f2801f60ae262842}, intrahash = {457948bdd5bbba0f47e64065e99bd805}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {337-341}, timestamp = {2020-02-25T13:23:25.000+0100}, title = {Modeling the impact of well contacts on SEE response with bias-dependent Single-Event compact model.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr81.html#DingCGWCLZP18}, volume = 81, year = 2018 }