%0 Conference Paper %1 conf/vlsid/MohammadS08 %A Mohammad, Mohammad Gh. %A Saluja, Kewal K. %B VLSI Design %D 2008 %I IEEE Computer Society %K dblp %P 157-162 %T Testing Flash Memories for Tunnel Oxide Defects. %U http://dblp.uni-trier.de/db/conf/vlsid/vlsid2008.html#MohammadS08 %@ 0-7695-3083-4

@inproceedings{conf/vlsid/MohammadS08, added-at = {2023-03-24T00:00:00.000+0100}, author = {Mohammad, Mohammad Gh. and Saluja, Kewal K.}, biburl = {https://www.bibsonomy.org/bibtex/25a79344708e123b1a2f77f42aad7bef6/dblp}, booktitle = {VLSI Design}, crossref = {conf/vlsid/2008}, ee = {https://doi.ieeecomputersociety.org/10.1109/VLSI.2008.41}, interhash = {3ddf8e4d3e2e85c3cc031eeb61410102}, intrahash = {5a79344708e123b1a2f77f42aad7bef6}, isbn = {0-7695-3083-4}, keywords = {dblp}, pages = {157-162}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:19:22.000+0200}, title = {Testing Flash Memories for Tunnel Oxide Defects.}, url = {http://dblp.uni-trier.de/db/conf/vlsid/vlsid2008.html#MohammadS08}, year = 2008 }