%0 Conference Paper %1 conf/vlsid/KarmakarC16 %A Karmakar, Rajit %A Chattopadhyay, Santanu %B VLSID %D 2016 %I IEEE Computer Society %K dblp %P 475-480 %T Thermal-Safe Schedule Generation for System-on-Chip Testing. %U http://dblp.uni-trier.de/db/conf/vlsid/vlsid2016.html#KarmakarC16 %@ 978-1-4673-8700-2

@inproceedings{conf/vlsid/KarmakarC16, added-at = {2023-03-24T00:00:00.000+0100}, author = {Karmakar, Rajit and Chattopadhyay, Santanu}, biburl = {https://www.bibsonomy.org/bibtex/2682494aa0e37fd3d784a6ac56e5e4e03/dblp}, booktitle = {VLSID}, crossref = {conf/vlsid/2016}, ee = {https://doi.ieeecomputersociety.org/10.1109/VLSID.2016.47}, interhash = {518a7fd6ec881a9450cb01220d051efe}, intrahash = {682494aa0e37fd3d784a6ac56e5e4e03}, isbn = {978-1-4673-8700-2}, keywords = {dblp}, pages = {475-480}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T01:05:31.000+0200}, title = {Thermal-Safe Schedule Generation for System-on-Chip Testing.}, url = {http://dblp.uni-trier.de/db/conf/vlsid/vlsid2016.html#KarmakarC16}, year = 2016 }