Inproceedings,
Statistical Ab Initio Analysis of Electron Trapping Oxide Defects in the Si/SiO2 Network.
C. Wilhelmer, M. Jech, D. Waldhoer, A. El-Sayed, L. Cvitkovich, and T. Grasser.ESSDERC, page 243-246. IEEE, (2021)
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- conf/essderc/WilhelmerJWECG21
- entry type
- inproceedings
- booktitle
- ESSDERC
- year
- 2021
- pages
- 243-246
- publisher
- IEEE
- crossref
- conf/essderc/2021
- ee
- https://doi.org/10.1109/ESSDERC53440.2021.9631833
- isbn
- 978-1-6654-3748-6
- url
- http://dblp.uni-trier.de/db/conf/essderc/essderc2021.html#WilhelmerJWECG21
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%1 conf/essderc/WilhelmerJWECG21
%A Wilhelmer, Christoph
%A Jech, Markus
%A Waldhoer, Dominic
%A El-Sayed, Al-Moatasem Bellah
%A Cvitkovich, Lukas
%A Grasser, Tibor
%B ESSDERC
%D 2021
%I IEEE
%K dblp
%P 243-246
%T Statistical Ab Initio Analysis of Electron Trapping Oxide Defects in the Si/SiO2 Network.
%U http://dblp.uni-trier.de/db/conf/essderc/essderc2021.html#WilhelmerJWECG21
%@ 978-1-6654-3748-6
@inproceedings{conf/essderc/WilhelmerJWECG21,
added-at = {2023-09-30T00:00:00.000+0200},
author = {Wilhelmer, Christoph and Jech, Markus and Waldhoer, Dominic and El-Sayed, Al-Moatasem Bellah and Cvitkovich, Lukas and Grasser, Tibor},
biburl = {https://www.bibsonomy.org/bibtex/24e2f86bcf7769583cdb0cc42f26379c8/dblp},
booktitle = {ESSDERC},
crossref = {conf/essderc/2021},
ee = {https://doi.org/10.1109/ESSDERC53440.2021.9631833},
interhash = {5f5eb8fb211b7230f4bc97ccc7939634},
intrahash = {4e2f86bcf7769583cdb0cc42f26379c8},
isbn = {978-1-6654-3748-6},
keywords = {dblp},
pages = {243-246},
publisher = {IEEE},
timestamp = {2024-04-09T10:00:03.000+0200},
title = {Statistical Ab Initio Analysis of Electron Trapping Oxide Defects in the Si/SiO2 Network.},
url = {http://dblp.uni-trier.de/db/conf/essderc/essderc2021.html#WilhelmerJWECG21},
year = 2021
}