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%0 Conference Paper
%1 conf/ats/MoghaddamRRJ11
%A Moghaddam, Elham K.
%A Rajski, Janusz
%A Reddy, Sudhakar M.
%A Janicki, Jakub
%B Asian Test Symposium
%D 2011
%I IEEE Computer Society
%K dblp
%P 267-272
%T Low Test Data Volume Low Power At-Speed Delay Tests Using Clock-Gating.
%U http://dblp.uni-trier.de/db/conf/ats/ats2011.html#MoghaddamRRJ11
%@ 978-1-4577-1984-4
@inproceedings{conf/ats/MoghaddamRRJ11,
added-at = {2023-03-24T00:00:00.000+0100},
author = {Moghaddam, Elham K. and Rajski, Janusz and Reddy, Sudhakar M. and Janicki, Jakub},
biburl = {https://www.bibsonomy.org/bibtex/2116bcaec5277f519f425c048acef0f43/dblp},
booktitle = {Asian Test Symposium},
crossref = {conf/ats/2011},
ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2011.46},
interhash = {6c75cc2910b3142c7ec6e5d9cdb6c060},
intrahash = {116bcaec5277f519f425c048acef0f43},
isbn = {978-1-4577-1984-4},
keywords = {dblp},
pages = {267-272},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T06:36:27.000+0200},
title = {Low Test Data Volume Low Power At-Speed Delay Tests Using Clock-Gating.},
url = {http://dblp.uni-trier.de/db/conf/ats/ats2011.html#MoghaddamRRJ11},
year = 2011
}