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%0 Journal Article
%1 journals/mr/DowneyMCF10
%A Downey, Brian P.
%A Mohney, Suzanne E.
%A Clark, Trevor E.
%A Flemish, Joseph R.
%D 2010
%J Microelectron. Reliab.
%K dblp
%N 12
%P 1967-1972
%T Reliability of aluminum-bearing ohmic contacts to SiC under high current density.
%U http://dblp.uni-trier.de/db/journals/mr/mr50.html#DowneyMCF10
%V 50
@article{journals/mr/DowneyMCF10,
added-at = {2020-02-22T00:00:00.000+0100},
author = {Downey, Brian P. and Mohney, Suzanne E. and Clark, Trevor E. and Flemish, Joseph R.},
biburl = {https://www.bibsonomy.org/bibtex/2311740ac40758e8e7125132c5ec9727c/dblp},
ee = {https://doi.org/10.1016/j.microrel.2010.07.007},
interhash = {7a5929dc9d611097f74b25e47e356e6c},
intrahash = {311740ac40758e8e7125132c5ec9727c},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = 12,
pages = {1967-1972},
timestamp = {2020-02-25T13:27:10.000+0100},
title = {Reliability of aluminum-bearing ohmic contacts to SiC under high current density.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr50.html#DowneyMCF10},
volume = 50,
year = 2010
}