%0 Conference Paper %1 conf/ram/SangSZCZ23 %A Sang, Tong %A Sun, Dai %A Zhao, Wei %A Chen, Ruohui %A Zeng, Zeng %B CIS-RAM %D 2023 %I IEEE %K dblp %P 186-191 %T Wafer Map Defect Recognition and Accurate Localization Based on Defect Completion Algorithm. %U http://dblp.uni-trier.de/db/conf/ram/cis-ram2023.html#SangSZCZ23 %@ 979-8-3503-0308-7

@inproceedings{conf/ram/SangSZCZ23, added-at = {2024-01-16T00:00:00.000+0100}, author = {Sang, Tong and Sun, Dai and Zhao, Wei and Chen, Ruohui and Zeng, Zeng}, biburl = {https://www.bibsonomy.org/bibtex/2861ef8e8ab623f6e3bd2eac23ed01a22/dblp}, booktitle = {CIS-RAM}, crossref = {conf/ram/2023}, ee = {https://doi.org/10.1109/CIS-RAM55796.2023.10370761}, interhash = {8189dbfb321405589697194d738ad297}, intrahash = {861ef8e8ab623f6e3bd2eac23ed01a22}, isbn = {979-8-3503-0308-7}, keywords = {dblp}, pages = {186-191}, publisher = {IEEE}, timestamp = {2024-04-10T02:42:38.000+0200}, title = {Wafer Map Defect Recognition and Accurate Localization Based on Defect Completion Algorithm.}, url = {http://dblp.uni-trier.de/db/conf/ram/cis-ram2023.html#SangSZCZ23}, year = 2023 }