Author of the publication

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Wafer Map Defect Recognition and Accurate Localization Based on Defect Completion Algorithm.

T. Sang, D. Sun, W. Zhao, R. Chen, and Z. Zeng. CIS-RAM, page 186-191. IEEE, (2023)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Tong Tong

Willi Tönges

Elisabeth Tönges

Koeyang Tong

Wu-Fu Tong

Other publications of authors with the same name

PMIC: Improving Multi-Agent Reinforcement Learning with Progressive Mutual Information Collaboration.P. Li, H. Tang, T. Yang, X. Hao, T. Sang, Y. Zheng, J. Hao, M. Taylor, and Z. Wang. CoRR, (2022)Latent Vector Prototypes Guided Conditional Face Synthesis.Q. Wei, X. Yang, T. Sang, H. Wang, X. Zou, Z. Cheng, Z. Zhao, and Z. Zeng. ICIP, page 3898-3902. IEEE, (2022)Surface Defect Detection Based on ResNet Classification Network with GAN Optimized.H. Fu, Z. Zhou, Z. Zeng, T. Sang, Y. Zhu, and X. Zheng. SmartWorld/UIC/ScalCom/DigitalTwin/PriComp/Meta, page 1568-1575. IEEE, (2022)Fabric Image Layering Based on Parallel K-means.L. Wang, W. Zhao, T. Sang, Z. Zeng, and Y. Li. HPCC/DSS/SmartCity/DependSys, page 1228-1233. IEEE, (2022)Wafer Map Defect Recognition and Accurate Localization Based on Defect Completion Algorithm.T. Sang, D. Sun, W. Zhao, R. Chen, and Z. Zeng. CIS-RAM, page 186-191. IEEE, (2023)Uncertainty-Aware Low-Rank Q-Matrix Estimation for Deep Reinforcement Learning.T. Sang, H. Tang, J. Hao, Y. Zheng, and Z. Meng. DAI, volume 13170 of Lecture Notes in Computer Science, page 21-37. Springer, (2021)PAnDR: Fast Adaptation to New Environments from Offline Experiences via Decoupling Policy and Environment Representations.T. Sang, H. Tang, Y. Ma, J. Hao, Y. Zheng, Z. Meng, B. Li, and Z. Wang. IJCAI, page 3416-3422. ijcai.org, (2022)PMIC: Improving Multi-Agent Reinforcement Learning with Progressive Mutual Information Collaboration.P. Li, H. Tang, T. Yang, X. Hao, T. Sang, Y. Zheng, J. Hao, M. Taylor, W. Tao, and Z. Wang. ICML, volume 162 of Proceedings of Machine Learning Research, page 12979-12997. PMLR, (2022)Fabric Image Layering Based on Kmeans-AP.L. Wang, W. Zhao, T. Sang, Y. Che, and Z. Zeng. ICVIP, page 144-148. ACM, (2022)Enhancing Semiconductor Chip Image Defect Classification Using Deep Learning and Segmented Defect Region Information.X. Zheng, T. Sang, R. Chen, and Z. Zeng. CIS-RAM, page 204-209. IEEE, (2023)

BibSonomy

Disambiguation of "Sang, Tong"

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Wafer Map Defect Recognition and Accurate Localization Based on Defect Completion Algorithm.

Please choose a person to relate this publication to

Tong Tong

Willi Tönges

Elisabeth Tönges

Koeyang Tong

Wu-Fu Tong

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Sang, Tong"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Wafer Map Defect Recognition and Accurate Localization Based on Defect Completion Algorithm.

Please choose a person to relate this publication to

Tong Tong

Willi Tönges

Elisabeth Tönges

Koeyang Tong

Wu-Fu Tong

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Wafer Map Defect Recognition and Accurate Localization Based on Defect Completion Algorithm.