%0 Journal Article %1 journals/mr/PomeroyULK15 %A Pomeroy, James W. %A Uren, Michael J. %A Lambert, Benoit %A Kuball, Martin %D 2015 %J Microelectron. Reliab. %K dblp %N 12 %P 2505-2510 %T Operating channel temperature in GaN HEMTs: DC versus RF accelerated life testing. %U http://dblp.uni-trier.de/db/journals/mr/mr55.html#PomeroyULK15 %V 55

@article{journals/mr/PomeroyULK15, added-at = {2020-02-22T00:00:00.000+0100}, author = {Pomeroy, James W. and Uren, Michael J. and Lambert, Benoit and Kuball, Martin}, biburl = {https://www.bibsonomy.org/bibtex/2c32cec070d06da8210354689c9060fde/dblp}, ee = {https://doi.org/10.1016/j.microrel.2015.09.025}, interhash = {924c32f216d30ccea74d517397083c61}, intrahash = {c32cec070d06da8210354689c9060fde}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 12, pages = {2505-2510}, timestamp = {2020-02-25T13:22:41.000+0100}, title = {Operating channel temperature in GaN HEMTs: DC versus RF accelerated life testing.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#PomeroyULK15}, volume = 55, year = 2015 }