%0 Conference Paper %1 conf/irps/FrancoKRBMRGHTG15 %A Franco, Jacopo %A Kaczer, Ben %A Roussel, Philippe J. %A Bury, Erik %A Mertens, Hans %A Ritzenthaler, Romain %A Grasser, Tibor %A Horiguchi, Naoto %A Thean, Aaron %A Groeseneken, Guido %B IRPS %D 2015 %I IEEE %K dblp %P 2 %T NBTI in Si0.55Ge0.45 cladding p-FinFETs: Porting the superior reliability from planar to 3D architectures. %U http://dblp.uni-trier.de/db/conf/irps/irps2015.html#FrancoKRBMRGHTG15 %@ 978-1-4673-7362-3

@inproceedings{conf/irps/FrancoKRBMRGHTG15, added-at = {2019-10-19T00:00:00.000+0200}, author = {Franco, Jacopo and Kaczer, Ben and Roussel, Philippe J. and Bury, Erik and Mertens, Hans and Ritzenthaler, Romain and Grasser, Tibor and Horiguchi, Naoto and Thean, Aaron and Groeseneken, Guido}, biburl = {https://www.bibsonomy.org/bibtex/222d1b7e630d93208a1756b02003cc19e/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2015}, ee = {https://doi.org/10.1109/IRPS.2015.7112694}, interhash = {9779388667b68c0702f15dee93182e0c}, intrahash = {22d1b7e630d93208a1756b02003cc19e}, isbn = {978-1-4673-7362-3}, keywords = {dblp}, pages = 2, publisher = {IEEE}, timestamp = {2019-10-22T14:41:40.000+0200}, title = {NBTI in Si0.55Ge0.45 cladding p-FinFETs: Porting the superior reliability from planar to 3D architectures.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2015.html#FrancoKRBMRGHTG15}, year = 2015 }