%0 Journal Article %1 journals/et/LouYZF12 %A Lou, Yi %A Yan, Zhuo %A Zhang, Fan %A Franzon, Paul D. %D 2012 %J J. Electron. Test. %K dblp %N 1 %P 27-38 %T Comparing Through-Silicon-Via (TSV) Void/Pinhole Defect Self-Test Methods. %U http://dblp.uni-trier.de/db/journals/et/et28.html#LouYZF12 %V 28

@article{journals/et/LouYZF12, added-at = {2020-09-11T00:00:00.000+0200}, author = {Lou, Yi and Yan, Zhuo and Zhang, Fan and Franzon, Paul D.}, biburl = {https://www.bibsonomy.org/bibtex/282e0cd60ec0a79dcd190f38c548cbb8e/dblp}, ee = {https://www.wikidata.org/entity/Q57432780}, interhash = {9d2e17ddef33ad920c6b2540e27a3df8}, intrahash = {82e0cd60ec0a79dcd190f38c548cbb8e}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 1, pages = {27-38}, timestamp = {2020-09-12T11:40:53.000+0200}, title = {Comparing Through-Silicon-Via (TSV) Void/Pinhole Defect Self-Test Methods.}, url = {http://dblp.uni-trier.de/db/journals/et/et28.html#LouYZF12}, volume = 28, year = 2012 }