%0 Journal Article %1 journals/tie/HuWGL20 %A Hu, Zhongxu %A Wang, Yan %A Ge, Ming-Feng %A Liu, Jie %D 2020 %J IEEE Trans. Ind. Electron. %K dblp %N 4 %P 3216-3225 %T Data-Driven Fault Diagnosis Method Based on Compressed Sensing and Improved Multiscale Network. %U http://dblp.uni-trier.de/db/journals/tie/tie67.html#HuWGL20 %V 67

@article{journals/tie/HuWGL20, added-at = {2022-01-03T00:00:00.000+0100}, author = {Hu, Zhongxu and Wang, Yan and Ge, Ming-Feng and Liu, Jie}, biburl = {https://www.bibsonomy.org/bibtex/2e7b1f49b240b9b3988c08f6e0b9325d0/dblp}, ee = {https://doi.org/10.1109/TIE.2019.2912763}, interhash = {a660c6dd160fbdcfab4ffaa8e731a047}, intrahash = {e7b1f49b240b9b3988c08f6e0b9325d0}, journal = {IEEE Trans. Ind. Electron.}, keywords = {dblp}, number = 4, pages = {3216-3225}, timestamp = {2024-04-08T10:32:53.000+0200}, title = {Data-Driven Fault Diagnosis Method Based on Compressed Sensing and Improved Multiscale Network.}, url = {http://dblp.uni-trier.de/db/journals/tie/tie67.html#HuWGL20}, volume = 67, year = 2020 }