%0 Journal Article %1 journals/tvlsi/KuoSLLC14 %A Kuo, Chun-Yi %A Shih, Chi-Jih %A Lu, Yi-Chang %A Li, James Chien-Mo %A Chakrabarty, Krishnendu %D 2014 %J IEEE Trans. Very Large Scale Integr. Syst. %K dblp %N 3 %P 667-674 %T Testing of TSV-Induced Small Delay Faults for 3-D Integrated Circuits. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi22.html#KuoSLLC14 %V 22

@article{journals/tvlsi/KuoSLLC14, added-at = {2022-01-03T00:00:00.000+0100}, author = {Kuo, Chun-Yi and Shih, Chi-Jih and Lu, Yi-Chang and Li, James Chien-Mo and Chakrabarty, Krishnendu}, biburl = {https://www.bibsonomy.org/bibtex/23ce3b45066a101cf606e855ff3f9b968/dblp}, ee = {https://doi.org/10.1109/TVLSI.2013.2250320}, interhash = {a7e6a15bf260fb0164a913c37b187edb}, intrahash = {3ce3b45066a101cf606e855ff3f9b968}, journal = {IEEE Trans. Very Large Scale Integr. Syst.}, keywords = {dblp}, number = 3, pages = {667-674}, timestamp = {2024-04-08T14:32:42.000+0200}, title = {Testing of TSV-Induced Small Delay Faults for 3-D Integrated Circuits.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi22.html#KuoSLLC14}, volume = 22, year = 2014 }