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Testing of TSV-Induced Small Delay Faults for 3-D Integrated Circuits.

C. Kuo, C. Shih, Y. Lu, J. Li, and K. Chakrabarty. IEEE Trans. Very Large Scale Integr. Syst., 22 (3): 667-674 (2014)

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Yi Lu

Yi-Chang Chiang

Hsin-Yi Chang

Chang-Han Yi

Other publications of authors with the same name

Parallel architecture and hardware implementation of pre-processor and post-processor for sequence assembly.Y. Kuo, C. Liu, Y. Li, and Y. Lu. ICASSP, page 1158-1161. IEEE, (2013)Three-Dimensional Dynamic Programming Accelerator for Multiple Sequence Alignment.R. Chien, Y. Liao, C. Wang, Y. Li, and Y. Lu. NORCAS, page 1-5. IEEE, (2018)MSRCall: a multi-scale deep neural network to basecall Oxford Nanopore sequences.Y. Yeh, and Y. Lu. Bioinform., 38 (16): 3877-3884 (2022)Attention EdgeConv For 3D Point Cloud Classification.Y. Lin, Y. Yeh, Y. Chou, and Y. Lu. APSIPA ASC, page 2018-2022. IEEE, (2021)Power efficient special processor design for burrows-wheeler-transform-based short read sequence alignment.N. Chen, T. Chiu, Y. Li, Y. Chien, and Y. Lu. BioCAS, page 1-4. IEEE, (2015)Test Generation of Path Delay Faults Induced by Defects in Power TSV.C. Shih, S. Hsieh, Y. Lu, J. Li, T. Wu, and K. Chakrabarty. Asian Test Symposium, page 43-48. IEEE Computer Society, (2013)Deep Co-occurrence Feature Learning for Visual Object Recognition.Y. Shih, Y. Yeh, Y. Lin, M. Weng, Y. Lu, and Y. Chuang. CVPR, page 7302-7311. IEEE Computer Society, (2017)Low-Light Enhancement Using a Plug-and-Play Retinex Model With Shrinkage Mapping for Illumination Estimation.Y. Lin, and Y. Lu. IEEE Trans. Image Process., (2022)Using Regularity Unit As Guidance For Summarization-Based Image Resizing.F. Hsiao, Y. Lin, and Y. Lu. VCIP, page 1-5. IEEE, (2021)A fast analytical technique for estimating the bounds of on-chip clock wire inductance.Y. Lu, K. Banerjee, M. Celik, and R. Dutton. CICC, page 241-244. IEEE, (2001)

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Disambiguation of "Lu, Yi-Chang"

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Testing of TSV-Induced Small Delay Faults for 3-D Integrated Circuits.

Please choose a person to relate this publication to

Yi Lu

Yi-Chang Chiang

Hsin-Yi Chang

Chang-Han Yi

Chang-Han Yi

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Lu, Yi-Chang"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Testing of TSV-Induced Small Delay Faults for 3-D Integrated Circuits.

Please choose a person to relate this publication to

Yi Lu

Yi-Chang Chiang

Hsin-Yi Chang

Chang-Han Yi

Chang-Han Yi

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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Testing of TSV-Induced Small Delay Faults for 3-D Integrated Circuits.