%0 Conference Paper %1 conf/vlsid/YadavDSTC16 %A Yadav, Chandan %A Dutta, Anupam %A Sirohi, Saurabh %A Tamilmani, Ethirajan %A Chauhan, Yogesh Singh %B VLSID %D 2016 %I IEEE Computer Society %K dblp %P 328-333 %T Unified Model for Sub-Bandgap and Conventional Impact Ionization in RF SOI MOSFETs with Improved Simulator Convergence. %U http://dblp.uni-trier.de/db/conf/vlsid/vlsid2016.html#YadavDSTC16 %@ 978-1-4673-8700-2

@inproceedings{conf/vlsid/YadavDSTC16, added-at = {2023-03-24T00:00:00.000+0100}, author = {Yadav, Chandan and Dutta, Anupam and Sirohi, Saurabh and Tamilmani, Ethirajan and Chauhan, Yogesh Singh}, biburl = {https://www.bibsonomy.org/bibtex/2d7f6b016bed26143dcc087938413886a/dblp}, booktitle = {VLSID}, crossref = {conf/vlsid/2016}, ee = {https://doi.ieeecomputersociety.org/10.1109/VLSID.2016.85}, interhash = {a805f502afee51a1a8a51945918d7305}, intrahash = {d7f6b016bed26143dcc087938413886a}, isbn = {978-1-4673-8700-2}, keywords = {dblp}, pages = {328-333}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T01:05:31.000+0200}, title = {Unified Model for Sub-Bandgap and Conventional Impact Ionization in RF SOI MOSFETs with Improved Simulator Convergence.}, url = {http://dblp.uni-trier.de/db/conf/vlsid/vlsid2016.html#YadavDSTC16}, year = 2016 }