%0 Journal Article %1 journals/tcad/AgrawalC95 %A Agrawal, Vishwani D. %A Chakradhar, Srimat T. %D 1995 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 9 %P 1155-1160 %T Combinational ATPG theorems for identifying untestable faults in sequential circuits. %U http://dblp.uni-trier.de/db/journals/tcad/tcad14.html#AgrawalC95 %V 14

@article{journals/tcad/AgrawalC95, added-at = {2020-09-24T00:00:00.000+0200}, author = {Agrawal, Vishwani D. and Chakradhar, Srimat T.}, biburl = {https://www.bibsonomy.org/bibtex/2d62fffcef97d0dac3e46efa2c6c381e4/dblp}, ee = {https://doi.org/10.1109/43.406717}, interhash = {a9b92623383aad5c444c9118de8c5e83}, intrahash = {d62fffcef97d0dac3e46efa2c6c381e4}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 9, pages = {1155-1160}, timestamp = {2020-09-25T11:46:22.000+0200}, title = {Combinational ATPG theorems for identifying untestable faults in sequential circuits.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad14.html#AgrawalC95}, volume = 14, year = 1995 }