%0 Journal Article %1 journals/tvlsi/KeshavarziRHD03 %A Keshavarzi, Ali %A Roy, Kaushik %A Hawkins, Charles F. %A De, Vivek %D 2003 %J IEEE Trans. Very Large Scale Integr. Syst. %K dblp %N 5 %P 863-870 %T Multiple-parameter CMOS IC testing with increased sensitivity for IDDQ. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi11.html#KeshavarziRHD03 %V 11

@article{journals/tvlsi/KeshavarziRHD03, added-at = {2020-03-11T00:00:00.000+0100}, author = {Keshavarzi, Ali and Roy, Kaushik and Hawkins, Charles F. and De, Vivek}, biburl = {https://www.bibsonomy.org/bibtex/23b47d519111b21c0e5216057b042076e/dblp}, ee = {https://doi.org/10.1109/TVLSI.2003.812298}, interhash = {b0ea98f4dab5760b4b1d1dfea343daef}, intrahash = {3b47d519111b21c0e5216057b042076e}, journal = {IEEE Trans. Very Large Scale Integr. Syst.}, keywords = {dblp}, number = 5, pages = {863-870}, timestamp = {2020-03-12T11:44:49.000+0100}, title = {Multiple-parameter CMOS IC testing with increased sensitivity for IDDQ.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi11.html#KeshavarziRHD03}, volume = 11, year = 2003 }