( en | de | ru )

 

Disambiguation of "Keshavarzi, Ali"

Author of the publication

copydeleteadd this publication to your clipboard
Multiple-parameter CMOS IC testing with increased sensitivity for IDDQ.

, , , and . IEEE Trans. Very Large Scale Integr. Syst., 11 (5): 863-870 (2003)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Farhad Keshavarzi

ali

Ali Aassie Ali

Ali Yasen Ali

Ali Ramadan Ali

 

Other publications of authors with the same name

FerroElectronics for Edge Intelligence., , , , and . IEEE Micro, 40 (6): 33-48 (2020)Towards site-specific management of soil organic carbon: Comparing support vector machine and ordinary kriging approaches based on pedo-geomorphometric factors., , , and . Comput. Electron. Agric., (January 2024)Test Methodologies in the Deep Submicron Era - Analog, Mixed-Signal, and RF., , , and . VLSI Design, page 12-13. IEEE Computer Society, (2005)Parameter variations and impact on circuits and microarchitecture., , , , , and . DAC, page 338-342. ACM, (2003)Adaptive circuit techniques to minimize variation impacts on microprocessor performance and power., , , and . ISCAS (1), page 9-12. IEEE, (2005)Effectiveness of reverse body bias for leakage control in scaled dual Vt CMOS ICs., , , , , , , and . ISLPED, page 207-212. ACM, (2001)Modeling soil cation exchange capacity using soil parameters: Assessing the heuristic models., , , , , , and . Comput. Electron. Agric., (2017)2 GHz 2 Mb 2T Gain Cell Memory Macro With 128 GBytes/sec Bandwidth in a 65 nm Logic Process Technology., , , , , , , , , and 1 other author(s). IEEE J. Solid State Circuits, 44 (1): 174-185 (2009)Leakage and Process Variation Effects in Current Testing on Future CMOS Circuits., , , , , , , and . IEEE Des. Test Comput., 19 (5): 36-43 (2002)Within Die Thermal Gradient Impact on Clock-Skew: A New Type of Delay-Fault Mechanism., , , , and . ITC, page 1276-1284. IEEE Computer Society, (2004)