%0 Conference Paper %1 conf/itc/WenYMKWSK05 %A Wen, Xiaoqing %A Yamashita, Yoshiyuki %A Morishima, Shohei %A Kajihara, Seiji %A Wang, Laung-Terng %A Saluja, Kewal K. %A Kinoshita, Kozo %B ITC %D 2005 %I IEEE Computer Society %K dblp %P 10 %T Low-capture-power test generation for scan-based at-speed testing. %U http://dblp.uni-trier.de/db/conf/itc/itc2005.html#WenYMKWSK05 %@ 0-7803-9038-5

@inproceedings{conf/itc/WenYMKWSK05, added-at = {2023-03-23T00:00:00.000+0100}, author = {Wen, Xiaoqing and Yamashita, Yoshiyuki and Morishima, Shohei and Kajihara, Seiji and Wang, Laung-Terng and Saluja, Kewal K. and Kinoshita, Kozo}, biburl = {https://www.bibsonomy.org/bibtex/28b4f8485605e14ae4c01b7399a7a1561/dblp}, booktitle = {ITC}, crossref = {conf/itc/2005}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2005.1584068}, interhash = {c3850d72b62f6c836c5707829596340d}, intrahash = {8b4f8485605e14ae4c01b7399a7a1561}, isbn = {0-7803-9038-5}, keywords = {dblp}, pages = 10, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:27:57.000+0200}, title = {Low-capture-power test generation for scan-based at-speed testing.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2005.html#WenYMKWSK05}, year = 2005 }