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Low-capture-power test generation for scan-based at-speed testing.

X. Wen, Y. Yamashita, S. Morishima, S. Kajihara, L. Wang, K. Saluja, and K. Kinoshita. ITC, page 10. IEEE Computer Society, (2005)

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Xiaoqing Pan

Xiaoqing Liu

Xiaoqing Shen

Xiaoqing Li

Xiaoqing Jin

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Cost-Effective and Highly Reliable Circuit-Components Design for Safety-Critical Applications.A. Yan, Z. Fan, L. Ding, J. Cui, Z. Huang, Q. Wang, H. Zheng, P. Girard, and X. Wen. IEEE Trans. Aerosp. Electron. Syst., 58 (1): 517-529 (2022)Two sextuple cross-coupled SRAM cells with double-node-upset protection and cost optimization for aerospace applications.A. Yan, J. Xiang, Y. Chang, Z. Huang, J. Cui, P. Girard, and X. Wen. Microelectron. J., (September 2023)Broadcast-TDMA: A Cost-Effective Fault-Tolerance Method for TSV Lifetime Reliability Enhancement.T. Ni, J. Bian, Z. Yang, M. Nie, L. Yao, Z. Huang, A. Yan, and X. Wen. IEEE Des. Test, 39 (5): 34-42 (2022)Mitigating Test-Induced Yield-Loss by IR-Drop-Aware X-Filling.S. Shi, S. Holst, and X. Wen. MCSoC, page 501-507. IEEE, (2023)A Novel Triple-Node-Upset-Tolerant CMOS Latch Design using Single-Node-Upset-Resilient Cells.Z. Song, A. Yan, J. Cui, Z. Chen, X. Li, X. Wen, C. Lai, Z. Huang, and H. Liang. ITC-Asia, page 139-144. IEEE, (2019)Novel Radiation Hardened Latch Design with Cost-Effectiveness for Safety-Critical Terrestrial Applications.A. Yan, Z. Wu, L. Lu, Z. Chen, J. Song, Z. Ying, P. Girard, and X. Wen. ATS, page 43-48. IEEE, (2019)Test Pattern Modification for Average IR-Drop Reduction.W. Ding, H. Hsieh, C. Han, J. Li, and X. Wen. IEEE Trans. Very Large Scale Integr. Syst., 24 (1): 38-49 (2016)Low-Power Scan-Based Built-In Self-Test Based on Weighted Pseudorandom Test Pattern Generation and Reseeding.D. Xiang, X. Wen, and L. Wang. IEEE Trans. Very Large Scale Integr. Syst., 25 (3): 942-953 (2017)Targeted Partial-Shift For Mitigating Shift Switching Activity Hot-Spots During Scan Test.S. Holst, S. Shi, and X. Wen. PRDC, page 124-129. IEEE, (2019)VirtualScan: Test Compression Technology Using Combinational Logic and One-Pass ATPG.L. Wang, X. Wen, S. Wu, Z. Wang, Z. Jiang, B. Sheu, and X. Gu. IEEE Des. Test Comput., 25 (2): 122-130 (2008)

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Disambiguation of "Wen, Xiaoqing"

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Low-capture-power test generation for scan-based at-speed testing.

Please choose a person to relate this publication to

Xiaoqing Pan

Xiaoqing Liu

Xiaoqing Shen

Xiaoqing Li

Xiaoqing Jin

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Wen, Xiaoqing"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Low-capture-power test generation for scan-based at-speed testing.

Please choose a person to relate this publication to

Xiaoqing Pan

Xiaoqing Liu

Xiaoqing Shen

Xiaoqing Li

Xiaoqing Jin

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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Low-capture-power test generation for scan-based at-speed testing.