%0 Conference Paper %1 conf/vts/MrugalskiTR00 %A Mrugalski, Grzegorz %A Tyszer, Jerzy %A Rajski, Janusz %B VTS %D 2000 %I IEEE Computer Society %K dblp %P 377-388 %T Linear Independence as Evaluation Criterion for Two-Dimensional Test Pattern Generators. %U http://dblp.uni-trier.de/db/conf/vts/vts2000.html#MrugalskiTR00 %@ 0-7695-0613-5

@inproceedings{conf/vts/MrugalskiTR00, added-at = {2023-03-24T00:00:00.000+0100}, author = {Mrugalski, Grzegorz and Tyszer, Jerzy and Rajski, Janusz}, biburl = {https://www.bibsonomy.org/bibtex/24114be30b7bfb7740ac380093bf2a8e1/dblp}, booktitle = {VTS}, crossref = {conf/vts/2000}, ee = {https://doi.ieeecomputersociety.org/10.1109/VTEST.2000.843868}, interhash = {d1415c4da0e4fe0baa55b0a0e467de5a}, intrahash = {4114be30b7bfb7740ac380093bf2a8e1}, isbn = {0-7695-0613-5}, keywords = {dblp}, pages = {377-388}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:45:09.000+0200}, title = {Linear Independence as Evaluation Criterion for Two-Dimensional Test Pattern Generators.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts2000.html#MrugalskiTR00}, year = 2000 }