Author of the publication

Linear Independence as Evaluation Criterion for Two-Dimensional Test Pattern Generators.

, , and . VTS, page 377-388. IEEE Computer Society, (2000)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Trimodal Scan-Based Test Paradigm., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 25 (3): 1112-1125 (2017)On Compaction Utilizing Inter and Intra-Correlation of Unknown States., , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 29 (1): 117-126 (2010)X-Press: Two-Stage X-Tolerant Compactor With Programmable Selector., , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 27 (1): 147-159 (2008)X-Press Compactor for 1000x Reduction of Test Data., , , , , and . ITC, page 1-10. IEEE Computer Society, (2006)EDT channel bandwidth management in SoC designs with pattern-independent test access mechanism., , , , , , and . ITC, page 1-9. IEEE Computer Society, (2011)Dynamic channel allocation for higher EDT compression in SoC designs., , , , , and . ITC, page 265-274. IEEE Computer Society, (2010)A deterministic BIST scheme based on EDT-compressed test patterns., , , , and . ITC, page 1-8. IEEE, (2015)Low Power Decompressor and PRPG with Constant Value Broadcast., , , , , , and . Asian Test Symposium, page 84-89. IEEE Computer Society, (2011)On Cyclic Scan Integrity Tests for EDT-based Compression., , , , and . VTS, page 1-6. IEEE, (2019)Highly X-Tolerant Selective Compaction of Test Responses., , , , and . VTS, page 245-250. IEEE Computer Society, (2009)