%0 Conference Paper %1 conf/drc/ZhangBRCELWGI18 %A Zhang, Junrui %A Bellando, Francesco %A Rupakula, Maneesha %A Cordero, Erick Garcia %A Ebejer, N. %A Longo, J. %A Wildhaber, Fabien %A Guerin, Hoel %A Ionescu, Adrian Mihai %B DRC %D 2018 %I IEEE %K dblp %P 1-2 %T CMOS 3D-Extended Metal Gate ISFETs with Near Nernstian Ion Sensitivity. %U http://dblp.uni-trier.de/db/conf/drc/drc2018.html#ZhangBRCELWGI18 %@ 978-1-5386-3028-0

@inproceedings{conf/drc/ZhangBRCELWGI18, added-at = {2020-10-02T00:00:00.000+0200}, author = {Zhang, Junrui and Bellando, Francesco and Rupakula, Maneesha and Cordero, Erick Garcia and Ebejer, N. and Longo, J. and Wildhaber, Fabien and Guerin, Hoel and Ionescu, Adrian Mihai}, biburl = {https://www.bibsonomy.org/bibtex/2ee7d3eabeeef6a17f9da6d595df6a49a/dblp}, booktitle = {DRC}, crossref = {conf/drc/2018}, ee = {https://doi.org/10.1109/DRC.2018.8442197}, interhash = {d5650fea0fb89e2a37fed67eea03dadc}, intrahash = {ee7d3eabeeef6a17f9da6d595df6a49a}, isbn = {978-1-5386-3028-0}, keywords = {dblp}, pages = {1-2}, publisher = {IEEE}, timestamp = {2024-04-09T23:47:17.000+0200}, title = {CMOS 3D-Extended Metal Gate ISFETs with Near Nernstian Ion Sensitivity.}, url = {http://dblp.uni-trier.de/db/conf/drc/drc2018.html#ZhangBRCELWGI18}, year = 2018 }