%0 Journal Article %1 journals/mr/SoldnerSHTGSCID07 %A Soldner, Wolfgang %A Streibl, Martin %A Hodel, U. %A Tiebout, Marc %A Gossner, Harald %A Schmitt-Landsiedel, Doris %A Chun, Jung-Hoon %A Ito, Choshu %A Dutton, Robert W. %D 2007 %J Microelectron. Reliab. %K dblp %N 7 %P 1008-1015 %T RF ESD protection strategies: Codesign vs. low-C protection. %U http://dblp.uni-trier.de/db/journals/mr/mr47.html#SoldnerSHTGSCID07 %V 47

@article{journals/mr/SoldnerSHTGSCID07, added-at = {2021-10-14T00:00:00.000+0200}, author = {Soldner, Wolfgang and Streibl, Martin and Hodel, U. and Tiebout, Marc and Gossner, Harald and Schmitt-Landsiedel, Doris and Chun, Jung-Hoon and Ito, Choshu and Dutton, Robert W.}, biburl = {https://www.bibsonomy.org/bibtex/2a496cbd5fcedd0241537fead283c2d5d/dblp}, ee = {https://doi.org/10.1016/j.microrel.2006.11.007}, interhash = {df0ff6bd0ccde10a607c14da7e9d41eb}, intrahash = {a496cbd5fcedd0241537fead283c2d5d}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 7, pages = {1008-1015}, timestamp = {2024-04-09T02:48:59.000+0200}, title = {RF ESD protection strategies: Codesign vs. low-C protection.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr47.html#SoldnerSHTGSCID07}, volume = 47, year = 2007 }