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%0 Journal Article
%1 journals/mr/SoldnerSHTGSCID07
%A Soldner, Wolfgang
%A Streibl, Martin
%A Hodel, U.
%A Tiebout, Marc
%A Gossner, Harald
%A Schmitt-Landsiedel, Doris
%A Chun, Jung-Hoon
%A Ito, Choshu
%A Dutton, Robert W.
%D 2007
%J Microelectron. Reliab.
%K dblp
%N 7
%P 1008-1015
%T RF ESD protection strategies: Codesign vs. low-C protection.
%U http://dblp.uni-trier.de/db/journals/mr/mr47.html#SoldnerSHTGSCID07
%V 47
@article{journals/mr/SoldnerSHTGSCID07,
added-at = {2021-10-14T00:00:00.000+0200},
author = {Soldner, Wolfgang and Streibl, Martin and Hodel, U. and Tiebout, Marc and Gossner, Harald and Schmitt-Landsiedel, Doris and Chun, Jung-Hoon and Ito, Choshu and Dutton, Robert W.},
biburl = {https://www.bibsonomy.org/bibtex/2a496cbd5fcedd0241537fead283c2d5d/dblp},
ee = {https://doi.org/10.1016/j.microrel.2006.11.007},
interhash = {df0ff6bd0ccde10a607c14da7e9d41eb},
intrahash = {a496cbd5fcedd0241537fead283c2d5d},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = 7,
pages = {1008-1015},
timestamp = {2024-04-09T02:48:59.000+0200},
title = {RF ESD protection strategies: Codesign vs. low-C protection.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr47.html#SoldnerSHTGSCID07},
volume = 47,
year = 2007
}