%0 Conference Paper %1 conf/vts/PatelHM03 %A Patel, Ketan N. %A Hayes, John P. %A Markov, Igor L. %B VTS %D 2003 %I IEEE Computer Society %K dblp %P 410-416 %T Fault Testing for Reversible Circuits. %U http://dblp.uni-trier.de/db/conf/vts/vts2003.html#PatelHM03 %@ 0-7695-1924-5

@inproceedings{conf/vts/PatelHM03, added-at = {2023-03-24T00:00:00.000+0100}, author = {Patel, Ketan N. and Hayes, John P. and Markov, Igor L.}, biburl = {https://www.bibsonomy.org/bibtex/2f31ffb0c37e3aab1446008a738c6affa/dblp}, booktitle = {VTS}, crossref = {conf/vts/2003}, ee = {https://doi.ieeecomputersociety.org/10.1109/VTEST.2003.1197682}, interhash = {f28275d43ae7643429e4bdf28a9f3336}, intrahash = {f31ffb0c37e3aab1446008a738c6affa}, isbn = {0-7695-1924-5}, keywords = {dblp}, pages = {410-416}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:45:20.000+0200}, title = {Fault Testing for Reversible Circuits.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts2003.html#PatelHM03}, year = 2003 }