%0 Conference Paper %1 conf/iccd/KamalXPAS12 %A Kamal, Mehdi %A Xie, Qing %A Pedram, Massoud %A Afzali-Kusha, Ali %A Safari, Saeed %B ICCD %D 2012 %I IEEE Computer Society %K dblp %P 352-357 %T An efficient reliability simulation flow for evaluating the hot carrier injection effect in CMOS VLSI circuits. %U http://dblp.uni-trier.de/db/conf/iccd/iccd2012.html#KamalXPAS12 %@ 978-1-4673-3051-0

@inproceedings{conf/iccd/KamalXPAS12, added-at = {2023-03-23T00:00:00.000+0100}, author = {Kamal, Mehdi and Xie, Qing and Pedram, Massoud and Afzali-Kusha, Ali and Safari, Saeed}, biburl = {https://www.bibsonomy.org/bibtex/231c0adb38837694a329ad4e9cea8c7ff/dblp}, booktitle = {ICCD}, crossref = {conf/iccd/2012}, ee = {https://doi.ieeecomputersociety.org/10.1109/ICCD.2012.6378663}, interhash = {6317ce13da4bbc8f625efd4dfd5fa9db}, intrahash = {31c0adb38837694a329ad4e9cea8c7ff}, isbn = {978-1-4673-3051-0}, keywords = {dblp}, pages = {352-357}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:24:36.000+0200}, title = {An efficient reliability simulation flow for evaluating the hot carrier injection effect in CMOS VLSI circuits.}, url = {http://dblp.uni-trier.de/db/conf/iccd/iccd2012.html#KamalXPAS12}, year = 2012 }