%0 Journal Article %1 journals/tetc/BarenghiHBSRK14 %A Barenghi, Alessandro %A Hocquet, Cédric %A Bol, David %A Standaert, François-Xavier %A Regazzoni, Francesco %A Koren, Israel %D 2014 %J IEEE Trans. Emerg. Top. Comput. %K dblp %N 2 %P 107-118 %T A Combined Design-Time/Test-Time Study of the Vulnerability of Sub-Threshold Devices to Low Voltage Fault Attacks. %U http://dblp.uni-trier.de/db/journals/tetc/tetc2.html#BarenghiHBSRK14 %V 2

@article{journals/tetc/BarenghiHBSRK14, added-at = {2021-10-14T00:00:00.000+0200}, author = {Barenghi, Alessandro and Hocquet, Cédric and Bol, David and Standaert, François-Xavier and Regazzoni, Francesco and Koren, Israel}, biburl = {https://www.bibsonomy.org/bibtex/2690c63f117ba1c588dbeea6a68a25c5e/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/TETC.2014.2316509}, interhash = {511ef09511a4b733476de838fe7fa33c}, intrahash = {690c63f117ba1c588dbeea6a68a25c5e}, journal = {IEEE Trans. Emerg. Top. Comput.}, keywords = {dblp}, number = 2, pages = {107-118}, timestamp = {2024-04-08T15:30:18.000+0200}, title = {A Combined Design-Time/Test-Time Study of the Vulnerability of Sub-Threshold Devices to Low Voltage Fault Attacks.}, url = {http://dblp.uni-trier.de/db/journals/tetc/tetc2.html#BarenghiHBSRK14}, volume = 2, year = 2014 }