%0 Conference Paper %1 Stephenson:2004:TDG %A Stephenson, Zoë %A Zhan, Yuan %A Clark, John %A McDermid, John %B Proceedings of the International Workshop on Software Product Line Testing (SPLiT 2004) %C Boston, MA %D 2004 %E Geppert, Birgit %E Krueger, Charles %E Li, Jenny %K binding generation line product testdata variant %P 13--18 %T Test Data Generation for Product Lines - A Mutation Testing Approach %X Modern product lines typically generate large and complex software products. There is an associated cost increase from the need to test such products, especially for a safety-critical embedded system. We propose a method by which characteristics of the product line can be used as a way of reducing the test data search space and providing effective test data for relevant testing problems. We illustrate this with a solution to the problem of checking that a generated instance is a correct reflection of the required behavior.

@inproceedings{Stephenson:2004:TDG, abstract = {Modern product lines typically generate large and complex software products. There is an associated cost increase from the need to test such products, especially for a safety-critical embedded system. We propose a method by which characteristics of the product line can be used as a way of reducing the test data search space and providing effective test data for relevant testing problems. We illustrate this with a solution to the problem of checking that a generated instance is a correct reflection of the required behavior.}, added-at = {2008-05-14T10:36:47.000+0200}, address = {Boston, MA}, author = {Stephenson, Zoë and Zhan, Yuan and Clark, John and McDermid, John}, available = {1}, biburl = {https://www.bibsonomy.org/bibtex/28439146ef6fcdee2f3481b1468064316/ist_spl}, booktitle = {Proceedings of the International Workshop on Software Product Line Testing ({SPL}i{T} 2004)}, category = {Testing}, description = {Computer Science Bibliography Collection}, editor = {Geppert, Birgit and Krueger, Charles and Li, Jenny}, interhash = {0e491b91579960794fb4c50eade5f29c}, intrahash = {8439146ef6fcdee2f3481b1468064316}, keywords = {binding generation line product testdata variant}, month = {August}, newinversion = {3.5}, note = {ST:Fokus liegt auf Test der Variablen Artefakte, es soll gezeigt werden dass das richtige Produkt abgeleitet wurde. Test der Korrekten Bindung. Testdaten-Generierung um zu zeigen, dass der Output sich für zwei unterschiedliche Varianten unterscheidet. Output wird dann gegen die Anforderungen der verschiedenen Varianten getestet, so kann festgestellt werden, ob die richtige Variante gebunden wurde. Technik erfordert lauffähiges Produkt. Entwicklung eines Tools, welches für zwei Sourceocde-Artefakte, die sich durch Variabilität unterscheiden, Testdaten generiert. Fazit: eher für die Überprüfung geeignet ob Varianten korrekt gebunden wurden. Kein Wiederverwendungsansatz für Testdaten, keine explizite Trennung der Testdatenermittlung für Domain / Application Engineering. }, pages = {13--18}, timestamp = {2008-05-14T10:36:47.000+0200}, title = {Test Data Generation for Product Lines - {A} Mutation Testing Approach}, year = 2004 }