Electron optics development for photo-electron spectrometers
B. Wannberg. Nuclear Instruments and Methods in Physics Research Section A: Accelerators,
Spectrometers, Detectors and Associated Equipment, 601 (1-2):
182--194(March 2009)
Abstract
The demand for simultaneous observation of photo-electron distributions
in several dimensions has made the hemispherical deflection analyzer
(HDA) and the time-of-flight (TOF) analyzer the dominating spectrometer
types. Some common limiting factors for resolution and sensitivity
are considered. Recent developments of the HDA and its lens system
which increase the energy range and angular acceptance are described.
The properties of a recently developed angle-resolving TOF system
(AR-TOF) are also described. The possibility to avoid integration
losses in energy or angular resolution by applying non-linear mappings
of the primary data is discussed.
%0 Journal Article
%1 Wannberg2009
%A Wannberg, Björn
%B Special issue in honour of Prof. Kai Siegbahn
%D 2009
%J Nuclear Instruments and Methods in Physics Research Section A: Accelerators,
Spectrometers, Detectors and Associated Equipment
%K Angular Electrostatic Hemispherical Photo-electron TOF analyzer, lens resolution spectrometers, systems,
%N 1-2
%P 182--194
%T Electron optics development for photo-electron spectrometers
%U http://www.sciencedirect.com/science/article/B6TJM-4V99T5P-4/2/03c876778acf02a690b0e21248dd35e4
%V 601
%X The demand for simultaneous observation of photo-electron distributions
in several dimensions has made the hemispherical deflection analyzer
(HDA) and the time-of-flight (TOF) analyzer the dominating spectrometer
types. Some common limiting factors for resolution and sensitivity
are considered. Recent developments of the HDA and its lens system
which increase the energy range and angular acceptance are described.
The properties of a recently developed angle-resolving TOF system
(AR-TOF) are also described. The possibility to avoid integration
losses in energy or angular resolution by applying non-linear mappings
of the primary data is discussed.
@article{Wannberg2009,
abstract = {The demand for simultaneous observation of photo-electron distributions
in several dimensions has made the hemispherical deflection analyzer
(HDA) and the time-of-flight (TOF) analyzer the dominating spectrometer
types. Some common limiting factors for resolution and sensitivity
are considered. Recent developments of the HDA and its lens system
which increase the energy range and angular acceptance are described.
The properties of a recently developed angle-resolving TOF system
(AR-TOF) are also described. The possibility to avoid integration
losses in energy or angular resolution by applying non-linear mappings
of the primary data is discussed.},
added-at = {2010-11-06T00:14:39.000+0100},
author = {Wannberg, Björn},
biburl = {https://www.bibsonomy.org/bibtex/285b2115502503986ffb396046e8e534c/nplumb},
booktitle = {Special issue in honour of Prof. Kai Siegbahn},
file = {:C\:\\Users\\Nick\\Documents\\Papers\\Wannberg - Electron optics development for photo-electron spectrometers.pdf:PDF},
interhash = {446a0cfc9cf851bb9157f1789fa99a73},
intrahash = {85b2115502503986ffb396046e8e534c},
issn = {0168-9002},
journal = {Nuclear Instruments and Methods in Physics Research Section A: Accelerators,
Spectrometers, Detectors and Associated Equipment},
keywords = {Angular Electrostatic Hemispherical Photo-electron TOF analyzer, lens resolution spectrometers, systems,},
month = mar,
number = {1-2},
owner = {Nick},
pages = {182--194},
timestamp = {2010-11-06T00:14:44.000+0100},
title = {Electron optics development for photo-electron spectrometers},
url = {http://www.sciencedirect.com/science/article/B6TJM-4V99T5P-4/2/03c876778acf02a690b0e21248dd35e4},
volume = 601,
year = 2009
}