%0 Conference Paper %1 borkar03 %A Borkar, Shekhar %A Karnik, Tanay %A Narendra, Siva %A Tschanz, Jim %A Keshavarzi, Ali %A De, Vivek %B DAC '03: Proceedings of the 40th conference on Design automation %C New York, NY, USA %D 2003 %I ACM Press %K asic yield variation process design %P 338--342 %R http://doi.acm.org/10.1145/775832.775920 %T Parameter variations and impact on circuits and microarchitecture %X Parameter variation in scaled technologies beyond 90nm will pose a major challenge for design of future high performance microprocessors. In this paper, we discuss process, voltage and temperature variations; and their impact on circuit and microarchitecture. Possible solutions to reduce the impact of parameter variations and to achieve higher frequency bins are also presented %@ 1-58113-688-9

@inproceedings{borkar03, abstract = {Parameter variation in scaled technologies beyond 90nm will pose a major challenge for design of future high performance microprocessors. In this paper, we discuss process, voltage and temperature variations; and their impact on circuit and microarchitecture. Possible solutions to reduce the impact of parameter variations and to achieve higher frequency bins are also presented}, added-at = {2007-01-16T15:59:57.000+0100}, address = {New York, NY, USA}, author = {Borkar, Shekhar and Karnik, Tanay and Narendra, Siva and Tschanz, Jim and Keshavarzi, Ali and De, Vivek}, biburl = {https://www.bibsonomy.org/bibtex/2c57d7bad99e6466d870d436a7d744869/bernauer}, booktitle = {DAC '03: Proceedings of the 40th conference on Design automation}, description = {Parameter variations and impact on circuits and microarchitecture}, doi = {http://doi.acm.org/10.1145/775832.775920}, interhash = {e97c4c0121ece441a458451c6dd06621}, intrahash = {c57d7bad99e6466d870d436a7d744869}, isbn = {1-58113-688-9}, keywords = {asic yield variation process design}, location = {Anaheim, CA, USA}, pages = {338--342}, publisher = {ACM Press}, timestamp = {2007-01-16T15:59:57.000+0100}, title = {Parameter variations and impact on circuits and microarchitecture}, year = 2003 }