%0 Journal Article %1 journals/mr/ZhangKOIMOSYHH15 %A Zhang, Li %A Koike, Mitsuo %A Ono, Mizuki %A Itai, Shogo %A Matsuzawa, Kazuya %A Ono, Syotaro %A Saito, Wataru %A Yamaguchi, Masakazu %A Hayase, Yohei %A Hara, Keiryo %D 2015 %J Microelectron. Reliab. %K dblp %N 9-10 %P 1559-1563 %T Comprehensive 2D-carrier profiling of low-doping region by high-sensitivity scanning spreading resistance microscopy (SSRM) for power device applications. %U http://dblp.uni-trier.de/db/journals/mr/mr55.html#ZhangKOIMOSYHH15 %V 55

@article{journals/mr/ZhangKOIMOSYHH15, added-at = {2020-11-12T00:00:00.000+0100}, author = {Zhang, Li and Koike, Mitsuo and Ono, Mizuki and Itai, Shogo and Matsuzawa, Kazuya and Ono, Syotaro and Saito, Wataru and Yamaguchi, Masakazu and Hayase, Yohei and Hara, Keiryo}, biburl = {https://www.bibsonomy.org/bibtex/2e0e685c46c74a582844ba9bbca54156e/dblp}, ee = {https://doi.org/10.1016/j.microrel.2015.06.142}, interhash = {440e1f7c2a984d47b0611a69c4d14599}, intrahash = {e0e685c46c74a582844ba9bbca54156e}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-10}, pages = {1559-1563}, timestamp = {2020-11-13T11:35:29.000+0100}, title = {Comprehensive 2D-carrier profiling of low-doping region by high-sensitivity scanning spreading resistance microscopy (SSRM) for power device applications.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#ZhangKOIMOSYHH15}, volume = 55, year = 2015 }