%0 Journal Article %1 journals/mr/BuiuHERLHC07 %A Buiu, Octavian %A Hall, Steve %A Engström, Olof %A Raeissi, B. %A Lemme, Max C. %A Hurley, Paul K. %A Cherkaoui, Karim %D 2007 %J Microelectron. Reliab. %K dblp %N 4-5 %P 678-681 %T Extracting the relative dielectric constant for "high-kappa layers" from CV measurements - Errors and error propagation. %U http://dblp.uni-trier.de/db/journals/mr/mr47.html#BuiuHERLHC07 %V 47

@article{journals/mr/BuiuHERLHC07, added-at = {2020-11-13T00:00:00.000+0100}, author = {Buiu, Octavian and Hall, Steve and Engström, Olof and Raeissi, B. and Lemme, Max C. and Hurley, Paul K. and Cherkaoui, Karim}, biburl = {https://www.bibsonomy.org/bibtex/2c83c02d1ca3fa6932b83e6fc48bf42ce/dblp}, ee = {https://doi.org/10.1016/j.microrel.2007.01.006}, interhash = {4233d48fb4ab7edd675ac62d251f2792}, intrahash = {c83c02d1ca3fa6932b83e6fc48bf42ce}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {4-5}, pages = {678-681}, timestamp = {2020-11-14T11:35:00.000+0100}, title = {Extracting the relative dielectric constant for "high-kappa layers" from CV measurements - Errors and error propagation.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr47.html#BuiuHERLHC07}, volume = 47, year = 2007 }