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Extracting the relative dielectric constant for "high-kappa layers" from CV measurements - Errors and error propagation.

O. Buiu, S. Hall, O. Engström, B. Raeissi, M. Lemme, P. Hurley, and K. Cherkaoui. Microelectron. Reliab., 47 (4-5): 678-681 (2007)

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Octavian Fagaras

Octavian Postavaru

Octavian Popescu

Octavian Fieß

Other publications of authors with the same name

Electrical and structural properties of hafnium silicate thin films.I. Mitrovic, O. Buiu, S. Hall, C. Bungey, T. Wagner, W. Davey, and Y. Lu. Microelectron. Reliab., 47 (4-5): 645-648 (2007)CMOS-compatible SOI micro-hotplate-based oxygen sensor.V. Avramescu, A. Luca, M. Brezeanu, S. Ali, F. Udrea, O. Buiu, C. Cobianu, B. Serban, J. Gardner, V. Dumitru and 1 other author(s). ESSDERC, page 280-283. IEEE, (2016)Optical and electrical characterization of hafnium oxide deposited by MOCVD.Y. Lu, O. Buiu, S. Hall, and P. Hurley. Microelectron. Reliab., 45 (5-6): 965-968 (2005)Electrical Percolation Threshold and Size Effects in Polyvinylpyrrolidone-Oxidized Single-Wall Carbon Nanohorn Nanocomposite: The Impact for Relative Humidity Resistive Sensors Design.B. Serban, C. Cobianu, N. Dumbravescu, O. Buiu, M. Bumbac, C. Nicolescu, C. Cobianu, M. Brezeanu, C. Pachiu, and M. Serbanescu. Sensors, 21 (4): 1435 (2021)On the development of a robust cyber security system for Internet of Things devices.O. Ionescu, V. Dumitru, E. Pricop, O. Buiu, C. Cobianu, M. Raneti, S. Pircalabu, and C. Marica. ECAI, page 1-5. IEEE, (2019)Edge current induced failure of semiconductor PN junction during operation in the breakdown region of electrical characteristic.V. Obreja, C. Codreanu, D. Poenar, and O. Buiu. Microelectron. Reliab., 51 (3): 536-542 (2011)A Silicon Synapse Based on a Charge Transfer Device for Spiking Neural Network Application.Y. Chen, S. Hall, L. McDaid, O. Buiu, and P. Kelly. ISNN (2), volume 3973 of Lecture Notes in Computer Science, page 1366-1373. Springer, (2006)A Solid-State Neuron for Spiking Neural Network Implementation.Y. Chen, S. Hall, L. McDaid, O. Buiu, and P. Kelly. Eng. Lett., 16 (1): 83-89 (2008)A Biologically Plausible Neuron Circuit.T. Dowrick, S. Hall, L. McDaid, O. Buiu, and P. Kelly. IJCNN, page 715-719. IEEE, (2007)Extracting the relative dielectric constant for "high-kappa layers" from CV measurements - Errors and error propagation.O. Buiu, S. Hall, O. Engström, B. Raeissi, M. Lemme, P. Hurley, and K. Cherkaoui. Microelectron. Reliab., 47 (4-5): 678-681 (2007)

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Disambiguation of "Buiu, Octavian"

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Extracting the relative dielectric constant for "high-kappa layers" from CV measurements - Errors and error propagation.

Please choose a person to relate this publication to

Octavian Fagaras

Octavian Postavaru

Octavian Postavaru

Octavian Popescu

Octavian Fieß

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Buiu, Octavian"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Extracting the relative dielectric constant for "high-kappa layers" from CV measurements - Errors and error propagation.

Please choose a person to relate this publication to

Octavian Fagaras

Octavian Postavaru

Octavian Postavaru

Octavian Popescu

Octavian Fieß

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
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Extracting the relative dielectric constant for "high-kappa layers" from CV measurements - Errors and error propagation.