%0 Conference Paper %1 conf/isqed/MishraBJ10 %A Mishra, Prateek %A Bhoj, Ajay N. %A Jha, Niraj K. %B ISQED %D 2010 %I IEEE %K dblp %P 347-355 %T Die-level leakage power analysis of FinFET circuits considering process variations. %U http://dblp.uni-trier.de/db/conf/isqed/isqed2010.html#MishraBJ10 %@ 978-1-4244-6455-5

@inproceedings{conf/isqed/MishraBJ10, added-at = {2017-05-25T00:00:00.000+0200}, author = {Mishra, Prateek and Bhoj, Ajay N. and Jha, Niraj K.}, biburl = {https://www.bibsonomy.org/bibtex/2a9e75dd6f5337c97fb772cf36d5d74af/dblp}, booktitle = {ISQED}, crossref = {conf/isqed/2010}, ee = {https://doi.org/10.1109/ISQED.2010.5450554}, interhash = {6337c980d3aff1210376b9813bcb49fa}, intrahash = {a9e75dd6f5337c97fb772cf36d5d74af}, isbn = {978-1-4244-6455-5}, keywords = {dblp}, pages = {347-355}, publisher = {IEEE}, timestamp = {2017-05-26T13:02:26.000+0200}, title = {Die-level leakage power analysis of FinFET circuits considering process variations.}, url = {http://dblp.uni-trier.de/db/conf/isqed/isqed2010.html#MishraBJ10}, year = 2010 }