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%0 Conference Paper
%1 conf/ats/YamadaYM95
%A Yamada, Teruhiko
%A Yamazaki, Koji
%A McCluskey, Edward J.
%B Asian Test Symposium
%D 1995
%I IEEE Computer Society
%K dblp
%P 65-70
%T A simple technique for locating gate-level faults in combinational circuits.
%U http://dblp.uni-trier.de/db/conf/ats/ats1995.html#YamadaYM95
%@ 0-8186-7129-7
@inproceedings{conf/ats/YamadaYM95,
added-at = {2023-03-24T00:00:00.000+0100},
author = {Yamada, Teruhiko and Yamazaki, Koji and McCluskey, Edward J.},
biburl = {https://www.bibsonomy.org/bibtex/22edcca54a581fd670764337dff6669c2/dblp},
booktitle = {Asian Test Symposium},
crossref = {conf/ats/1995},
ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.1995.485318},
interhash = {70503c25bb9d011309c79d5bc840751f},
intrahash = {2edcca54a581fd670764337dff6669c2},
isbn = {0-8186-7129-7},
keywords = {dblp},
pages = {65-70},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T04:35:47.000+0200},
title = {A simple technique for locating gate-level faults in combinational circuits.},
url = {http://dblp.uni-trier.de/db/conf/ats/ats1995.html#YamadaYM95},
year = 1995
}