%0 Journal Article %1 journals/chinaf/CaiCKDLZ21 %A Cai, Linlin %A Chen, Wangyong %A Kang, Jinfeng %A Du, Gang %A Liu, Xiaoyan %A Zhang, Xing %D 2021 %J Sci. China Inf. Sci. %K dblp %N 11 %T A physics-based electromigration reliability model for interconnects lifetime prediction. %U http://dblp.uni-trier.de/db/journals/chinaf/chinaf64.html#CaiCKDLZ21 %V 64

@article{journals/chinaf/CaiCKDLZ21, added-at = {2021-12-29T00:00:00.000+0100}, author = {Cai, Linlin and Chen, Wangyong and Kang, Jinfeng and Du, Gang and Liu, Xiaoyan and Zhang, Xing}, biburl = {https://www.bibsonomy.org/bibtex/22b09760469723f836f69dea6614baec4/dblp}, ee = {https://doi.org/10.1007/s11432-020-3140-4}, interhash = {7ac8e486f9d953248ac9191e10a7682c}, intrahash = {2b09760469723f836f69dea6614baec4}, journal = {Sci. China Inf. Sci.}, keywords = {dblp}, number = 11, timestamp = {2024-04-08T20:26:15.000+0200}, title = {A physics-based electromigration reliability model for interconnects lifetime prediction.}, url = {http://dblp.uni-trier.de/db/journals/chinaf/chinaf64.html#CaiCKDLZ21}, volume = 64, year = 2021 }