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A physics-based electromigration reliability model for interconnects lifetime prediction.

L. Cai, W. Chen, J. Kang, G. Du, X. Liu, and X. Zhang. Sci. China Inf. Sci., (2021)

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Jinfeng Du

Jinfeng Feng

Mihyun Kang

Ewha Kang

Mujin Kang

Other publications of authors with the same name

Design and Hardware Implementation of Neuromorphic Systems With RRAM Synapses and Threshold-Controlled Neurons for Pattern Recognition.Y. Jiang, P. Huang, D. Zhu, Z. Zhou, R. Han, L. Liu, X. Liu, and J. Kang. IEEE Trans. Circuits Syst. I Regul. Pap., 65-I (9): 2726-2738 (2018)The synthesis method of logic circuits based on the iMemComp gates.X. Cui, Q. Lin, X. Cui, F. Wei, X. Liu, and J. Kang. Integr., (2020)An ultra-high-density and energy-efficient content addressable memory design based on 3D-NAND flash.H. Yang, P. Huang, R. Han, X. Liu, and J. Kang. Sci. China Inf. Sci., (April 2023)STAR: Synthesis of Stateful Logic in RRAM Targeting High Area Utilization.F. Wang, G. Luo, G. Sun, J. Zhang, J. Kang, Y. Wang, D. Niu, and H. Zheng. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 40 (5): 864-877 (2021)A Novel Convolution Computing Paradigm Based on NOR Flash Array with High Computing Speed and Energy Efficient.R. Han, P. Huang, Y. Xiang, C. Liu, Z. Dong, Z. Su, Y. Liu, L. Liu, X. Liu, and J. Kang. ISCAS, page 1-4. IEEE, (2018)A physics-based electromigration reliability model for interconnects lifetime prediction.L. Cai, W. Chen, J. Kang, G. Du, X. Liu, and X. Zhang. Sci. China Inf. Sci., (2021)Device and Circuit Interaction Analysis of Stochastic Behaviors in Cross-Point RRAM Arrays.H. Li, P. Huang, B. Gao, X. Liu, J. Kang, and H. Wong. CoRR, (2016)FNSim: A Device-Circuit-Algorithm Codesigned Simulator for Flash based Neural Network.M. Zhang, P. Huang, Y. Zhang, Y. Xiang, R. Han, L. Liu, X. Liu, and J. Kang. ASICON, page 1-4. IEEE, (2019)Circuit design of RRAM-based neuromorphic hardware systems for classification and modified Hebbian learning.Y. Jiang, P. Huang, Z. Zhou, and J. Kang. Sci. China Inf. Sci., 62 (6): 62408:1-62408:19 (2019)A novel voltage-type sense amplifier for low-power nonvolatile memories.M. Li, J. Kang, and Y. Wang. Sci. China Inf. Sci., 53 (8): 1676-1681 (2010)

BibSonomy

Disambiguation of "Kang, Jinfeng"

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A physics-based electromigration reliability model for interconnects lifetime prediction.

Please choose a person to relate this publication to

Jinfeng Du

Jinfeng Feng

Mihyun Kang

Ewha Kang

Mujin Kang

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Kang, Jinfeng"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML A physics-based electromigration reliability model for interconnects lifetime prediction.

Please choose a person to relate this publication to

Jinfeng Du

Jinfeng Feng

Mihyun Kang

Ewha Kang

Mujin Kang

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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A physics-based electromigration reliability model for interconnects lifetime prediction.