%0 Conference Paper %1 conf/date/TangCRWRP05 %A Tang, Huaxing %A Chen, Gang %A Reddy, Sudhakar M. %A Wang, Chen %A Rajski, Janusz %A Pomeranz, Irith %B DATE %D 2005 %I IEEE Computer Society %K dblp %P 450-455 %T Defect Aware Test Patterns. %U http://dblp.uni-trier.de/db/conf/date/date2005.html#TangCRWRP05 %@ 0-7695-2288-2

@inproceedings{conf/date/TangCRWRP05, added-at = {2023-03-24T00:00:00.000+0100}, author = {Tang, Huaxing and Chen, Gang and Reddy, Sudhakar M. and Wang, Chen and Rajski, Janusz and Pomeranz, Irith}, biburl = {https://www.bibsonomy.org/bibtex/24a6c6c92f09748ae03b237bdde84f010/dblp}, booktitle = {DATE}, crossref = {conf/date/2005}, ee = {http://dl.acm.org/citation.cfm?id=1049147}, interhash = {9790eaccbd4549a80aaacea4ea79da22}, intrahash = {4a6c6c92f09748ae03b237bdde84f010}, isbn = {0-7695-2288-2}, keywords = {dblp}, pages = {450-455}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:52:06.000+0200}, title = {Defect Aware Test Patterns.}, url = {http://dblp.uni-trier.de/db/conf/date/date2005.html#TangCRWRP05}, year = 2005 }