%0 Journal Article %1 journals/iet-cdt/YangKPLK07 %A Yang, Myung-Hoon %A Kim, Youbean %A Park, Youngkyu %A Lee, D. %A Kang, Sungho %D 2007 %J IET Comput. Digit. Tech. %K dblp %N 4 %P 369-376 %T Deterministic built-in self-test using split linear feedback shift register reseeding for low-power testing. %U http://dblp.uni-trier.de/db/journals/iet-cdt/iet-cdt1.html#YangKPLK07 %V 1

@article{journals/iet-cdt/YangKPLK07, added-at = {2020-07-14T00:00:00.000+0200}, author = {Yang, Myung-Hoon and Kim, Youbean and Park, Youngkyu and Lee, D. and Kang, Sungho}, biburl = {https://www.bibsonomy.org/bibtex/297dceb651be8794c667d09dda111731c/dblp}, ee = {https://doi.org/10.1049/iet-cdt:20060114}, interhash = {9e3ddc28f5894ecdc169f701bd11f900}, intrahash = {97dceb651be8794c667d09dda111731c}, journal = {IET Comput. Digit. Tech.}, keywords = {dblp}, number = 4, pages = {369-376}, timestamp = {2020-07-24T00:16:29.000+0200}, title = {Deterministic built-in self-test using split linear feedback shift register reseeding for low-power testing.}, url = {http://dblp.uni-trier.de/db/journals/iet-cdt/iet-cdt1.html#YangKPLK07}, volume = 1, year = 2007 }